The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 2023

Filed:

Oct. 03, 2017
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Ganmei You, Beijing, CN;

Zhigang Wang, Beijing, CN;

Dawei Wang, Beijing, CN;

Hu Chen, Beijing, CN;

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 17/89 (2020.01); G06T 7/521 (2017.01); G01S 17/931 (2020.01); G01S 7/4913 (2020.01); G01S 7/487 (2006.01); G01S 7/497 (2006.01);
U.S. Cl.
CPC ...
G01S 17/89 (2013.01); G01S 7/4873 (2013.01); G01S 7/4913 (2013.01); G01S 17/931 (2020.01); G06T 7/521 (2017.01); G06T 2207/20212 (2013.01);
Abstract

A technology is described for mapping a physical environment. An example method may include receiving laser point data for laser light reflected from the physical environment and detected by a laser sensor. Points included in the laser point data can be correlated to grid cells in an environment map that represents the physical environment. Error ranges for the points correlated to the grid cells can be determined based in part on an error distribution. Occupation probabilities can then be calculated for the grid cells in the environment map using an interpolation technique and grid cell occupation probabilities for adjacent error grid cells selected based in part on the error ranges of the points, and the grid cells in the environment map can be updated with the occupation probabilities.


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