The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 2023

Filed:

Dec. 28, 2020
Applicant:

Stmicroelectronics, Inc., Coppell, TX (US);

Inventors:

Mahaveer Jain, Santa Clara, CA (US);

Mahesh Chowdhary, San Jose, CA (US);

Assignee:

STMicroelectronics, Inc., Coppell, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/00 (2006.01); G01C 25/00 (2006.01);
U.S. Cl.
CPC ...
G01R 33/0035 (2013.01); G01C 25/005 (2013.01);
Abstract

An electronic device includes a magnetometer that outputs magnetometer sensor signals and a gyroscope that outputs gyroscope sensor signals. The electronic device includes a magnetometer calibration module that calibrates the magnetometer utilizing the gyroscope sensor signals. The electronic device generates a first magnetometer calibration parameter based on a Kalman filter process. The electronic device generates a second magnetometer calibration parameter based on a least squares estimation process.


Find Patent Forward Citations

Jain, Mahaveer. (2023). System and method for fast magnetometer calibration using gyroscope (U.S. Patent No. 11815568). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11815568

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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