The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 07, 2023

Filed:

Jan. 12, 2021
Applicant:

Ambarella International Lp, Santa Clara, CA (US);

Inventors:

Ke-ke Ren, ShangHai, CN;

Zhi He, Shanghai, CN;

Assignee:

Ambarella International LP, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/128 (2018.01); G06T 7/593 (2017.01); H04N 13/239 (2018.01); H04N 13/00 (2018.01);
U.S. Cl.
CPC ...
H04N 13/128 (2018.05); G06T 7/593 (2017.01); H04N 13/239 (2018.05); G06T 2207/10021 (2013.01); G06T 2207/20228 (2013.01); H04N 2013/0081 (2013.01);
Abstract

An apparatus including an interface and a processor. The interface may be configured to receive pixel data. The processor may be configured to generate a reference image and a target image from the pixel data, perform disparity operations on the reference image and the target image and build a disparity map in response to the disparity operations. The disparity operations may comprise selecting a guide node from the pixel data comprising a pixel and a plurality of surrounding pixels, determining a peak location for the pixel by performing a full range search, calculating a shift offset peak location for each of the surrounding pixels by performing block matching operations in a local range near the peak location and generating values in a disparity map for the pixel data in response to the peak location for the pixel and the shift offset peak location for each of the surrounding pixels.


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