The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 07, 2023

Filed:

Aug. 16, 2021
Applicant:

National Cheng Kung University, Tainan, TW;

Inventor:

Wen-Hsi Lee, Tainan, TW;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01G 4/232 (2006.01); C25D 3/38 (2006.01); C25D 5/50 (2006.01); C25D 7/00 (2006.01); H01G 4/012 (2006.01); H01G 4/30 (2006.01); C23C 18/54 (2006.01);
U.S. Cl.
CPC ...
H01G 4/2325 (2013.01); C23C 18/54 (2013.01); C25D 3/38 (2013.01); C25D 5/50 (2013.01); C25D 7/00 (2013.01); H01G 4/012 (2013.01); H01G 4/30 (2013.01);
Abstract

A method is provided for fabricating a terminal electrode. The terminal electrode is applied on a multilayer ceramic capacitor (MLCC). The method prints inner electrodes on full area together with protective layers. The MLCC uses the thickness of thinned dielectric ceramic layers and the stacking of nickel inner-electrode layers. High capacitance is achieved at ends and sides with high electrode-to-ceramic ratios. Thus, the present invention uses a coating technology of ultra-low-temperature electrochemical deposition to fabricate low internal-stress MLCC terminal electrodes together with insulating protective layers for improving MLCC yield while cost reduced.


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