The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 07, 2023
Filed:
Aug. 12, 2022
Micron Technology, Inc., Boise, ID (US);
Kishore Kumar Muchherla, Fremont, CA (US);
Harish R. Singidi, Fremont, CA (US);
Renato C. Padilla, Folsom, CA (US);
Vamsi Pavan Rayaprolu, San Jose, CA (US);
Ashutosh Malshe, Fremont, CA (US);
Sampath K. Ratnam, Boise, ID (US);
Micron Technology, Inc., Boise, ID (US);
Abstract
A processing device in a memory system maintains a counter to track a number of read operations performed on a data block of a memory device and determines that the number of read operations performed on the data block satisfies a first threshold criterion. The processing device further determines whether a number of scan operations performed on the data block satisfies a scan threshold criterion. Responsive to the number of scan operations performed on the data block satisfying the scan threshold criterion, the processing device performs a first data integrity scan to determine one or more first error rates for the data block, each of the one or more first error rates corresponding to a first set of wordlines of the data block, the first set comprising first alternating pairs of adjacent wordlines.