The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 07, 2023
Filed:
Mar. 11, 2022
Intel Corporation, Santa Clara, CA (US);
Mahesh Deshmane, Chandler, AZ (US);
Shoujie He, Plano, TX (US);
Christopher Wade Ackerman, Phoenix, AZ (US);
Jacob Hales, Eagle Mountain, UT (US);
Johnny Mata Vega, Alajuela, CR;
Joseph Zearing, Chandler, AZ (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
An apparatus includes a processor configured to control an automatic test equipment (ATE) to measure one or more parameters of a current test instance for testing a device under test (DUT), during execution of the current test instance on the DUT, and determine, based on the measured one or more parameters, one or more controls for controlling a temperature of a thermal head connected to the DUT so that a junction temperature of the DUT corresponds to a predetermined test temperature. The processor is further configured to control the temperature of the thermal head, based on the determined one or more controls.