The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 2023
Filed:
Nov. 05, 2020
Zte Corporation, Guangdong, CN;
Yanchun Zhuang, Shenzhen, CN;
Hua Gao, Shenzhen, CN;
Kunjing Zhong, Shenzhen, CN;
Fei Xue, Shenzhen, CN;
ZTE Corporation, Shenzhen, CN;
Abstract
Provided are a method, apparatus and system for measuring total radiated power of an array antenna. The method includes: determining a Rayleigh resolution of the array antenna in an angle space, and setting a stepping grid spacing of sampling points according to the Rayleigh resolution; determining the sampling points according to the stepping grid spacing, measuring equivalent isotropic radiated power (EIRP) at positions of the sampling points, and determining the TRP according to the EIRP. Compared with a traditional test mode using an angle stepping grid θand φof 15°, this reduces measurement errors; and additionally, through a normalized wave vector space transformation, the number of sampling points is further reduced, and the measurement efficiency is improved.