The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 31, 2023

Filed:

Dec. 29, 2021
Applicant:

Wuhan Xinxin Semiconductor Manufacturing Co., Ltd., Wuhan, CN;

Inventors:

Qiong Zhan, Wuhan, CN;

Sheng Hu, Wuhan, CN;

Jun Zhou, Wuhan, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/00 (2006.01); H01L 21/768 (2006.01);
U.S. Cl.
CPC ...
H01L 24/03 (2013.01); H01L 21/76897 (2013.01); H01L 24/06 (2013.01); H01L 24/08 (2013.01); H01L 24/80 (2013.01); H01L 2224/03009 (2013.01); H01L 2224/0345 (2013.01); H01L 2224/0362 (2013.01); H01L 2224/03845 (2013.01); H01L 2224/06517 (2013.01); H01L 2224/08145 (2013.01); H01L 2224/80895 (2013.01); H01L 2224/80896 (2013.01);
Abstract

A method of fabricating an IC device is disclosed, in which a dielectric layer is first etched to form a contact opening and a dummy opening. Both do not extend through the dielectric layer, the contact opening has a width greater than that of the dummy opening. A sacrificial layer, which covers inner surface of the dummy opening and the dielectric layer at side surface of the contact opening, and from which the dielectric layer at bottom surface of the contact opening is exposed, is then formed, and under protection of this sacrificial layer, the dielectric layer exposed in the contact opening is etched in a self-aligned manner, a self-aligned contact hole is formed, in which a surface of the conductive structure is exposed. In this way, reliability of a contact that extends in both contact opening and self-aligned contact hole is ensured, avoiding the problem of possible contact failure.


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