The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2023

Filed:

Dec. 09, 2019
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventor:

Shiang-Bau Wang, Taoyuan County, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 27/088 (2006.01); H01L 29/06 (2006.01); H01L 29/78 (2006.01); H01L 21/8234 (2006.01); H01L 21/324 (2006.01); H01L 29/66 (2006.01);
U.S. Cl.
CPC ...
H01L 27/0886 (2013.01); H01L 21/324 (2013.01); H01L 21/823431 (2013.01); H01L 21/823481 (2013.01); H01L 29/0653 (2013.01); H01L 29/66795 (2013.01); H01L 29/7853 (2013.01);
Abstract

A method for forming a fin field effect transistor (FinFET) device structure and method for forming the same are provided. The method includes providing a substrate, and forming a fin structure on the substrate. The method also includes forming a protection layer on the sidewalls of the fin structure, and forming a dielectric layer on the fin structure and the protection layer. The method further includes removing a portion of the dielectric layer until a portion of the protection layer is exposed, and removing the exposed portion of the protection layer, such that the sidewalls of a lower portion of the fin structure are covered by the protection layer, and the sidewalls of an upper portion of the fin structure are not covered by the protection layer.


Find Patent Forward Citations

Loading…