The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 2023
Filed:
Oct. 31, 2022
Climate Llc, Saint Louis, MO (US);
Carlos Carrion, Sunnyvale, CA (US);
Nicholas Cizek, Stanford, CA (US);
James Delaney, Tiburon, CA (US);
Gardar Johannesson, Oakland, CA (US);
Moslem Ladoni, Dublin, CA (US);
Ricardo Lemos, San Francisco, CA (US);
Brian Lutz, St. Charles, MO (US);
Maria Terres, San Francisco, CA (US);
CLIMATE LLC, Saint Louis, MO (US);
Abstract
Systems and methods for utilizing a spatial statistical model to maximize efficacy in performing trials on agronomic fields are disclosed herein. In an embodiment, a system receives first yield data for a first portion of an agronomic field having received a first treatment, and second yield data for a second portion of the agronomic field having received a second treatment different than the first treatment. The system uses a spatial statistical model and the first yield data to compute a yield value for the second portion of the agronomic field, where the yield value indicates an agronomic yield for the second portion of the agronomic field if the second portion of the agronomic field had received the first treatment instead of the second treatment. Based on the computed yield value and the second yield data, the system selects the second treatment and generates a prescription map including the second treatment.