The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2023

Filed:

Dec. 05, 2022
Applicant:

Nanotronics Imaging, Inc., Cuyahoga Falls, OH (US);

Inventors:

John B. Putman, Celebration, FL (US);

Matthew C. Putman, Brooklyn, NY (US);

Vadim Pinskiy, Wayne, NJ (US);

Denis Y. Sharoukhov, Brooklyn, NY (US);

Assignee:

Nanotronics Imaging, Inc., Cuyahoga Falls, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/24 (2006.01); G02B 21/00 (2006.01); G02B 21/36 (2006.01); G02B 7/38 (2021.01); G01N 15/14 (2006.01); H04N 23/67 (2023.01); H04N 23/45 (2023.01);
U.S. Cl.
CPC ...
G02B 21/244 (2013.01); G01N 15/147 (2013.01); G02B 7/38 (2013.01); G02B 21/002 (2013.01); G02B 21/242 (2013.01); G02B 21/247 (2013.01); G02B 21/365 (2013.01); H04N 23/67 (2023.01); H04N 23/45 (2023.01);
Abstract

An automatic focus system for an optical microscope that facilitates faster focusing by using at least two offset focusing cameras. Each offset focusing camera can be positioned on a different side of an image forming conjugate plane so that their sharpness curves intersect at the image forming conjugate plane. Focus of a specimen can be adjusted by using sharpness values determined from images taken by the offset focusing cameras.


Find Patent Forward Citations

Putman, John. (2023). Systems, devices and methods for automatic microscope focus (U.S. Patent No. 11796785). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11796785

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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