The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2023

Filed:

Oct. 27, 2020
Applicant:

Microvision, Inc., Redmond, WA (US);

Inventors:

Hanno Holzhüter, Hamburg, DE;

Frederik Lange, Regensburg, DE;

Christian Fellenberg, Hamburg, DE;

Assignee:

Microvision, Inc., Redmond, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 7/4865 (2020.01); G01S 17/931 (2020.01); G01S 17/10 (2020.01);
U.S. Cl.
CPC ...
G01S 7/4865 (2013.01); G01S 17/10 (2013.01); G01S 17/931 (2020.01);
Abstract

What is proposed is a method for optically measuring distances, in the case of which a first plurality of measuring pulses is emitted during a first measuring interval by means of a transmitting element of a transmitting unit at first emitting times, and wherein a second plurality of measuring pulses is emitted during a second measuring interval by means of the transmitting element of the transmitting unit at second emitting times. The method comprises the reception of reflected measuring pulses by means of a receiving element of a receiving unit assigned to the transmitting element at receiving times. The method further comprises the determining of a first amount of times-of-flight for each received measuring pulse, wherein the first amount of times-of-flight is determined by using the first emitting times.


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