The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2023

Filed:

May. 11, 2020
Applicant:

Synopsys, Inc., Mountain View, CA (US);

Inventor:

Donald John Oriordan, Sunnyvale, CA (US);

Assignee:

Synopsys, Inc., Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/20 (2020.01); G06F 30/39 (2020.01); G06F 119/08 (2020.01); G06F 119/02 (2020.01); G06F 119/04 (2020.01);
U.S. Cl.
CPC ...
G06F 30/20 (2020.01); G06F 30/39 (2020.01); G06F 2119/02 (2020.01); G06F 2119/04 (2020.01); G06F 2119/08 (2020.01);
Abstract

A method, a system, and non-transitory computer readable medium for aging analysis are provided. The method includes performing stress simulations for a plurality of process, voltage, temperature (PVT) conditions for a circuit, the circuit including one or more devices, extrapolating device level stresses obtained from the stress simulations into device level parameter degradations to a desired circuit age; and performing degradation simulations for the circuit for the same PVT conditions based on the device level parameter degradations. Each degradation simulation for a PVT condition of the plurality of PVT conditions is performed using the device level parameter degradations associated with the same PVT condition.


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