The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2023

Filed:

Dec. 23, 2020
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Deepak Kumar Mishra, Tamil Nadu, IN;

Prajesh Ambili Rajendran, Telangana, IN;

Taj un nisha N, TamilNadu, IN;

Rahuldeva Ghosh, Portland, OR (US);

Paul Carlson, Hillsboro, OR (US);

Zheng Zhang, Portland, OR (US);

Assignee:

INTEL CORPORATION, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 21/55 (2013.01); G06F 21/56 (2013.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 21/566 (2013.01); G06F 21/564 (2013.01); G06F 21/568 (2013.01); G06N 20/00 (2019.01);
Abstract

A method comprises generating a first set of hardware performance counter (HPC) events that is ranked based on an ability of an individual HPC event to profile a malware class, generating a second set of HPC event combinations that is ranked based on an ability of a set of at least two joint HPC events to profile a malware class, generating a third set of extended HPC event combinations, profiling one or more malware events and one or more benign applications to obtain a detection accuracy parameter for each malware event, applying a machine learning model to rank the third set of HPC event combinations based on malware detection accuracy, and applying a genetic algorithm to the third set of HPC event combinations to identify a subset of the third set of extended combinations of HPC events to be used for malware detection and classification.


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