Single-pass diagnosis for multiple chain defects

Abstract

Disclosed herein are method, system, and storage-medium embodiments for single-pass diagnosis of multiple chain defects in circuit-design testing. Embodiments include processor(s) to select a plurality of a scan chains in a circuit under test and determine presence of at least a first defect in the first scan chain, and a second defect in the first scan chain or in the second scan chain. The plurality of scan chains may include specific scan chains that each have respective pluralities of scan cells. Processor(s) may map the first defect to a first range of first scan cells, and the second defect to a second range of second scan cells. Based at least in part on a failing capture-pattern set, processor(s) may locate the first defect in a first scan cell of the first range, and the second defect in a second scan cell of the first range or the second range.