The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2023
Filed:
Mar. 23, 2022
Applicant:
Advantest Corporation, Tokyo, JP;
Inventors:
Koji Asami, Tokyo, JP;
Shin Masuda, Tokyo, JP;
Assignee:
ADVANTEST CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/10 (2006.01); G01R 29/08 (2006.01);
U.S. Cl.
CPC ...
G01R 29/10 (2013.01); G01R 29/0885 (2013.01);
Abstract
A test apparatus inspects an antenna element or a device including the antenna element as a DUT by OTA. A front-end unit includes a plurality of electric field detection elements provided to face a plurality of points on a radiation surface of the antenna element of the DUT. The plurality of electric field detection elements can simultaneously detect the electric fields formed at the corresponding points by the DUT, respectively. A tester body receives a plurality of detection signals from the front-end unit and evaluates the DUT.