The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2023

Filed:

Jun. 03, 2021
Applicant:

Semes Co., Ltd., Chungcheongnam-do, KR;

Inventors:

Sung Ho Kim, Chungcheongnam-do, KR;

Yoon Ok Jang, Chungcheongnam-do, KR;

Hyun Min Lee, Gyeongsangnam-do, KR;

Jun Seok Lee, Chungcheongnam-do, KR;

Kwang Jun Choi, Daejeon, KR;

Assignee:

Semes Co., Ltd., Chungcheongnam-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 2/045 (2006.01); B41J 3/407 (2006.01);
U.S. Cl.
CPC ...
B41J 2/04505 (2013.01); B41J 2/04508 (2013.01); B41J 2/04551 (2013.01); B41J 2/04558 (2013.01); B41J 3/407 (2013.01);
Abstract

An ink impact point correction apparatus for automatically measuring and correcting an impact point of ink using a pattern on a substrate, on which a coordinate system is displayed, and a substrate treating system including the same are provided. The ink impact point correction apparatus includes a recognition unit for acquiring information on the impact point of ink at a plurality of points located on a substrate; and a correction unit for correcting a position of an ink discharge point on the substrate based on the information on the impact point, wherein a coordinate pattern in the form of a coordinate system is formed at the plurality of points.


Find Patent Forward Citations

Kim, Sung. (2023). Apparatus for correcting impact point of ink and system for treating substrate with the apparatus (U.S. Patent No. 11787171). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11787171

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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