The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 2023

Filed:

Feb. 23, 2021
Applicant:

Anritsu Corporation, Kanagawa, JP;

Inventors:

Akinobu Tsuyuki, Kanagawa, JP;

Tomohiro Ito, Kanagawa, JP;

Assignee:

ANRITSU CORPORATION, Kanagawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 1/00 (2006.01); H04L 27/02 (2006.01);
U.S. Cl.
CPC ...
H04L 1/0045 (2013.01); H04L 27/02 (2013.01);
Abstract

An object of the present disclosure is to enable a network test even if a network is operated on the premise that an error occurs. According to the present disclosure, there is provided a network test apparatus including: a reception unit that receives a forward error correction symbol (FEC symbol) generated by using pulse amplitude modulation (PAM); a display unit; an input unit that acquires a threshold value for a pass or fail determination; and an arithmetic processing unit that corrects a symbol error of the FEC symbol received by the reception unit and performs the pass or fail determination based on the acquired threshold value by using the number of corrected symbol errors is provided, in which a result of the pass or fail determination is displayed on the display unit.


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