The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2023
Filed:
Aug. 04, 2022
Micron Technology, Inc., Boise, ID (US);
Kishore Kumar Muchherla, Fremont, CA (US);
Shane Nowell, Boise, ID (US);
Mustafa N. Kaynak, San Diego, CA (US);
Karl D. Schuh, Santa Cruz, CA (US);
Jiangang Wu, Milpitas, CA (US);
Devin M. Batutis, San Jose, CA (US);
Xiangang Luo, Fremont, CA (US);
Micron Technology, Inc., Boise, ID (US);
Abstract
A system includes a memory device and a processing device. The processing device performs, at a first frequency, a first scan of a page of a block family that measures a first data state metric and identifies a specific bin corresponding to a measured value for the first data state metric. Processing device updates a bin, to which the page is assigned, to match the specific bin. Processing device performs, at a second frequency higher than the first frequency, a second scan of the page to measure a second data state metric for read operations performed using a threshold voltage offset value from each of multiple bins. Processing device updates the bin, to which the page is assigned for the specified die, to match a second bin having the threshold voltage offset value that yields a lowest read bit error rate from the second scan.