The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2023
Filed:
Oct. 25, 2018
Particle Measuring Systems, Inc., Boulder, CO (US);
Nir Karasikov, Haifa, IL;
Ori Weinstein, Haifa, IL;
Shoam Shwartz, Haifa, IL;
Mehran Vahdani Moghaddam, Haifa, IL;
Uri Dubin, Haifa, IL;
PARTICLE MEASURING SYSTEMS, INC., Boulder, CO (US);
Abstract
An optical system for particle size and concentration analysis, includes: at least one laser that produces an illuminating beam; a focusing lens that focuses the illuminating beam on particles that move relative to the illuminating beam at known or pre-defined angles to the illuminating beam through the focal region of the focusing lens; and at least two forward-looking detectors, that detect interactions of particles with the illuminating beam in the focal region of the focusing lens. The focusing lens is a cylindrical lens that forms a focal region that is: (i) narrow in the direction of relative motion between the particles and the illuminating beam, and (ii) wide in a direction perpendicular to a plane defined by an optical axis of the system and the direction of relative motion between the particles and the illuminating beam. Each of the two forward-looking detectors is comprised of two segmented linear arrays of detectors.