The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 26, 2023

Filed:

Nov. 24, 2021
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Hoang Tran Van, Phoenix, AZ (US);

Neethu Elizabeth Simon, Chandler, AZ (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/30 (2006.01); G06F 11/07 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3058 (2013.01); G06F 11/0706 (2013.01); G06F 11/076 (2013.01); G06F 11/0772 (2013.01); G06F 11/3089 (2013.01); G06F 11/3409 (2013.01); G06F 2201/81 (2013.01);
Abstract

Systems, apparatuses, and methods include technology that generates synthesized sensors that synthesize operations of a first plurality of sensors using independent variables, such as sensors, as first inputs, where the first plurality of sensors is to sense conditions of operations of a system as the system executes a process based on a first input, and further where the conditions are stored as a first output. The technology generates a second output based on the synthesized sensors and the first input and detects whether one or more of a degradation and an anomalous state exists based on a comparison of the first output to the second output.


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