The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 2023

Filed:

Jul. 06, 2022
Applicants:

Stmicroelectronics Application Gmbh, Aschheim-Dornach, DE;

Stmicroelectronics International N.v., Geneva, CH;

Inventors:

Vivek Mohan Sharma, New Delhi, IN;

Roberto Colombo, Munich, DE;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/11 (2006.01); H03M 13/00 (2006.01);
U.S. Cl.
CPC ...
H03M 13/1105 (2013.01); H03M 13/611 (2013.01);
Abstract

A processing system is described. The processing system comprises a microprocessor, a memory controller, a resource and a communication system. The microprocessor is configured to send read requests in order to request the transmission of first data, or write requests comprising second data. The memory controller is configured to read third data from a memory. The processing system comprises also a safety monitor circuit comprising an error detection circuit configured to receive data bits and respective Error Correction Code, ECC, bits, wherein the data bits correspond to the first, second or third data. The safety monitor circuit calculates further ECC bits and generates an error signal by comparing the calculated ECC bits with the received ECC bits. A fault collection and error management circuit receives the error signal from the safety monitor circuits. For example the safety monitor circuit comprises a test circuit configured to provide modified data bits and/or modified ECC bits to the error detection circuit as a function of connectivity test control signals, whereby the error detection circuit asserts the error signal as a function of the connectivity test control signals. The processing system comprises also a connectivity test control circuit comprising control registers programmable via the microprocessor, wherein the connectivity test control signals are generated as a function of the content of the control registers.


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