The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 2023

Filed:

Sep. 23, 2022
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Seungjune Jeon, Santa Clara, CA (US);

Zhenming Zhou, San Jose, CA (US);

Zhenlei Shen, Milpitas, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/34 (2006.01); G11C 16/26 (2006.01); G06F 9/30 (2018.01); G11C 29/42 (2006.01); G11C 16/10 (2006.01);
U.S. Cl.
CPC ...
G11C 16/34 (2013.01); G06F 9/30101 (2013.01); G11C 16/10 (2013.01); G11C 16/26 (2013.01); G11C 29/42 (2013.01);
Abstract

A request to read data at the memory device is received. A first read operation is performed to read the data at the memory device using a first read threshold voltage. The data read at the memory device using the first read threshold voltage is determined to be associated with a first unsuccessful correction of an error. Responsive to determining that the data read at the memory device using the first read threshold voltage is associated with the first unsuccessful correction of the error, a second read threshold voltage is stored at a register to replace a preread threshold voltage previously stored at the register that is associated with the memory device. The first preread threshold voltage was previously used to perform a preread operation at the memory device. A second read operation to read the data at the memory device is performed using the second read threshold voltage.


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