The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 2023

Filed:

Jun. 10, 2019
Applicant:

Siemens Healthcare Diagnostics Inc., Tarrytown, NY (US);

Inventors:

Kai Ma, West Windsor, NJ (US);

Yao-Jen Chang, Princeton, NJ (US);

Terrence Chen, Princeton, NJ (US);

Benjamin S. Pollack, Jersey City, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/12 (2017.01); G01N 33/49 (2006.01); G06T 7/70 (2017.01); G16H 10/40 (2018.01); G01N 35/04 (2006.01); G06F 18/2431 (2023.01);
U.S. Cl.
CPC ...
G06T 7/12 (2017.01); G01N 33/49 (2013.01); G01N 35/04 (2013.01); G06F 18/2431 (2023.01); G06T 7/70 (2017.01); G16H 10/40 (2018.01); G01N 2035/0406 (2013.01); G01N 2035/0493 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract

A method of characterizing a serum or plasma portion of a specimen in a specimen container includes capturing a plurality of images of the specimen container from multiple viewpoints, stacking the multiple viewpoint images along a channel dimension into a single stacked input, and processing the stacked input with a single deep convolutional neural network (SDNN). The SDNN includes a segmentation convolutional neural network that receives the stacked input and outputs multiple label maps simultaneously. The SDNN also includes a classification convolutional neural network that processes the multiple label maps and outputs an HILN determination (Hemolysis, Icterus, and/or Lipemia, or Normal) of the serum or plasma portion of the specimen. Quality check modules and testing apparatus configured to carry out the method are also described, as are other aspects.


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