The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2023
Filed:
Dec. 17, 2020
Applicant:
Synopsys, Inc., Mountain View, CA (US);
Inventors:
Ankush Bharati Oberai, Fremont, CA (US);
Rajesh Ramesh Sahani, Mumbai, IN;
Assignee:
Synopsys, Inc., Sunnyvale, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/392 (2020.01); G06F 30/398 (2020.01); G06F 30/323 (2020.01);
U.S. Cl.
CPC ...
G06F 30/392 (2020.01); G06F 30/323 (2020.01); G06F 30/398 (2020.01);
Abstract
A defect map may be created by merging defects at locations on multiple dies that include copies of an integrated circuit (IC). Layout shapes or nets may be determined that overlap with the defects in the defect map. Next, connectivity between the layout shapes or nets may be determined. The defects may then be grouped into defect groups based on the connectivity between the layout shapes or nets, where each defect group comprises defects that overlap with layout shapes or nets that are electrically connected to each other.