The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 2023

Filed:

May. 19, 2020
Applicant:

Anritsu Corporation, Kanagawa, JP;

Inventors:

Eiji Taniguchi, Kanagawa, JP;

Chie Nishimura, Kanagawa, JP;

Yuki Hayakawa, Kanagawa, JP;

Assignee:

ANRITSU CORPORATION, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/10 (2006.01); G01R 33/10 (2006.01); G01V 3/08 (2006.01); G01V 3/38 (2006.01); G01N 27/72 (2006.01);
U.S. Cl.
CPC ...
G01V 3/10 (2013.01); G01N 27/72 (2013.01); G01R 33/10 (2013.01); G01V 3/081 (2013.01); G01V 3/38 (2013.01);
Abstract

A metal detection apparatus that can accurately and automatically determine whether a metal passing through the inspection area is a magnetic or non-magnetic metal comprises a detection unit quadrature-detecting a differential detection signal of magnetic field fluctuation in the inspection area due to the passage of a workpiece, and a determination unit that determines the presence or absence of a mixed metal based on both fluctuation components after the detection. The determination unit compares sample signal phase data obtained beforehand from the detection signal of the magnetic field fluctuation in the inspection area due to the passage of various metal samples, with the signal phase data obtained from the detection signal of the magnetic field fluctuation in the inspection area due to the passage of the workpiece mixed with metal, and determines the type of metal passing through the inspection area based on the phase determination result.


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