The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2023
Filed:
Apr. 16, 2021
Applicant:
Micron Technology, Inc., Boise, ID (US);
Inventor:
Sebastien Andre Jean, Meridian, ID (US);
Assignee:
Micron Technology, Inc., Boise, ID (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/34 (2006.01); G01R 31/3193 (2006.01); G11C 29/52 (2006.01); G11C 29/44 (2006.01); G11C 29/56 (2006.01);
U.S. Cl.
CPC ...
G11C 16/3495 (2013.01); G01R 31/31935 (2013.01); G11C 29/52 (2013.01); G11C 2029/4402 (2013.01); G11C 2029/5606 (2013.01);
Abstract
Disclosed in some examples are methods, systems, memory devices, machine readable mediums configured to intentionally degrade NAND performance when a value of a NAND health metric indicates a potential for failure to encourage users to replace or backup their devices before data loss occurs. For example, the system may track a NAND health metric and when that metric reaches a predetermined threshold or state, the system may intentionally degrade performance. This performance degradation may be more effective than a warning to effect device backup or replacement.