The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2023
Filed:
Dec. 28, 2021
Synopsys, Inc., Mountain View, CA (US);
Shivakumar Shankar Chonnad, San Jose, CA (US);
Radu Horia Iacob, Hillsboro, OR (US);
Vladimir Litovtchenko, Ebersberg, DE;
Synopsys, Inc., Sunnyvale, CA (US);
Abstract
A method for dependent failure analysis of a circuit design includes obtaining a circuit design comprising a plurality of circuit elements, and generating a first cone of influence and a second cone of influence for the circuit design. The first cone of influence corresponds to a first one or more inputs of the circuit design. The second cone of influence corresponds to a second one or more inputs of the circuit design. The method further includes determining a first shared circuit element of the circuit elements within a first intersection between the first cone of influence and the second cone of influence. Further, the method includes determining a first coupling factor based on the first intersection between the first cone of influence and the second cone of influence, and outputting the first shared circuit element and the first coupling factor to a memory.