The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2023

Filed:

Jul. 14, 2021
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Kishore Kumar Muchherla, Fremont, CA (US);

Peter Sean Feeley, Boise, ID (US);

Sampath K. Ratnam, Boise, ID (US);

Ashutosh Malshe, Fremont, CA (US);

Christopher S. Hale, Boise, ID (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/128 (2016.01); G06F 12/02 (2006.01); G06F 12/0897 (2016.01);
U.S. Cl.
CPC ...
G06F 12/0253 (2013.01); G06F 12/0246 (2013.01); G06F 12/0897 (2013.01); G06F 12/128 (2013.01);
Abstract

A method includes identifying a first block of a plurality of blocks stored at a first memory based on an amount of valid data of the first block, and writing the valid data of the first block from the first memory to a second memory. The first memory has a first memory type and the second memory has a second memory type different from the first memory type. The method further includes identifying a second block of the plurality of blocks stored at the first memory based on an age of valid data of the second block, determining that the age of the valid data of the second block satisfies a threshold condition, and in response to determining that the age of the valid data of the second block satisfies the threshold condition, writing the valid data of the second block from the first memory to the second memory.


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