The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2023
Filed:
May. 13, 2022
Advantest Test Solutions, Inc., San Jose, CA (US);
Samer Kabbani, Laguna Niguel, CA (US);
Paul Ferrari, Mission Viejo, CA (US);
Ikeda Hiroki, Kukishi Saitama, JP;
Kiyokawa Toshiyuki, Kukishi Saitama, JP;
Gregory Cruzan, Anaheim, CA (US);
Karthik Ranganathan, Foothill Ranch, CA (US);
Todd Berk, Rancho Santa Margarita, CA (US);
Ian Williams, Huntington Beach, CA (US);
Mohammad Ghazvini, Laguna Niguel, CA (US);
Tom Jones, San Jose, CA (US);
Advantest Test Solutions, Inc., San Jose, CA (US);
Abstract
A stand-alone active thermal interposer device for use in testing a system-in-package device under test (DUT), the active thermal interposer device includes a body layer having a first surface and a second surface, wherein the first surface is operable to be disposed adjacent to a cold plate, and a plurality of heating zones defined across a second surface of the body layer, the plurality of heating zones operable to be controlled by a thermal controller to selectively heat and maintain respective temperatures thereof, the plurality of heating zones operable to heat a plurality of areas of the DUT when the second surface of the body layer is disposed adjacent to an interface surface of the DUT during testing of the DUT.