The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 2023

Filed:

Mar. 28, 2022
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Ariel Doubchak, Herzliya, IL;

Avner Dor, Kfar Saba, IL;

Yaron Shany, Kfar Saba, IL;

Tal Philosof, Givatayim, IL;

Yoav Shereshevski, Tel-Aviv, IL;

Amit Berman, Binyamina, IL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/30 (2006.01); G08C 25/00 (2006.01); H03M 13/00 (2006.01); H04L 1/00 (2006.01); H03M 13/11 (2006.01);
U.S. Cl.
CPC ...
H03M 13/1174 (2013.01); H03M 13/1108 (2013.01); H03M 13/616 (2013.01);
Abstract

A method of correcting data stored in a memory device includes: applying an iterative decoder to the data; determining a total number of rows in first data the decoder attempted to correct; estimating first visible error rows among the total number that continue to have an error after the attempt; estimating residual error rows among the total number that no longer have an error after the attempt; determining second visible error rows in second data of the decoder that continue to have an error by permuting indices of the residual error rows according to a permutation; and correcting the first data using the first visible error rows.


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