The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 2023

Filed:

Jul. 08, 2019
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Martin Weiss, Portland, OR (US);

Apratim Dhar, Portland, OR (US);

Aaron M. White, Beaverton, OR (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/73 (2017.01); G06V 10/75 (2022.01); H01L 23/498 (2006.01); H01L 23/544 (2006.01); G03F 1/44 (2012.01); G03F 1/42 (2012.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G03F 1/42 (2013.01); G03F 1/44 (2013.01); G06T 7/74 (2017.01); G06V 10/751 (2022.01); H01L 23/49838 (2013.01); H01L 23/544 (2013.01); G06T 2207/30148 (2013.01); H01L 2223/54426 (2013.01);
Abstract

Embodiments disclosed herein include a lithography reticle set and methods of using such reticle sets. In an embodiment, the set comprises a first reticle and a second reticle. In an embodiment, the first reticle comprises a first grating having a first pitch, and a second grating having a second pitch. In an embodiment, the second reticle comprises a third grating having a third pitch, wherein the third pitch is different than the first pitch, and a fourth grating having a fourth pitch, wherein the fourth pitch is different than the first pitch. In an embodiment the third grating overlaps the first grating and the fourth grating overlaps the second grating when two or more edges of the first reticle are aligned with two or more edges of the second reticle. In an embodiment the first reticle or the second reticle further comprises a pattern recognition feature.


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