The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 2023
Filed:
Jan. 27, 2021
Sap SE, Walldorf, DE;
Wendan Chen, Vancouver, CA;
Susanne Hempel, Vancouver, CA;
Abdallah El Sahhar, Dubai, AE;
Ute Weingart, Schwetzingen, DE;
Takane Ozaki, Tokyo, JP;
Koichi Tsumoto, Vancouver, CA;
Boliang Chen, Vancouver, CA;
Zhong Xian Hu, Vancouver, CA;
Zhen Cheng, Vancouver, CA;
Bowen Zhang, Vancouver, CA;
Liufang Wu, Shanghai, CN;
Qiming Xu, Shanghai, CN;
SAP SE, Walldorf, DE;
Abstract
Techniques and solutions are provided for a source quality check service configured to analyze source text and identify issues in the source text. The source quality check service may identify the issues by performing a selected subset of checks with a centralized source quality check engine, and may be called from within one or more of an Integrated Development Environment (IDE), a build process, and/or a translation process to perform the selected subset of checks. The source quality check service may be further configured to output a report of the identified one or more issues.