The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2023

Filed:

Aug. 09, 2021
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Gaurav Singh, Kolkata, IN;

Prashant Parashari, Hyderabad, IN;

Assignee:

MICRON TECHNOLOGY, INC., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 3/0619 (2013.01); G06F 3/0659 (2013.01); G06F 3/0673 (2013.01); G06F 11/073 (2013.01); G06F 11/076 (2013.01);
Abstract

Exemplary methods, apparatuses, and systems include receiving a plurality of read operations. The read operations are divided into a current set of a sequence of read operations and one or more other sets. The size of the current set is a first number of read operations. An aggressor read operation is selected from the current set. A first data integrity scan is performed on a victim of the aggressor and a first indicator of data integrity is determined based on the first data integrity scan. A scaling factor is determined using the indicator of data integrity and a number of program erase cycles for the portion of memory. The set size of read operations is adjusted to a second number of read operations using the scaling factor for a subsequent set.


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