The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 2023
Filed:
May. 31, 2022
Applicant:
Synopsys, Inc., Mountain View, CA (US);
Inventor:
Emil I. Gizdarski, Cupertino, CA (US);
Assignee:
Synopsys, Inc., Mountain View, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318536 (2013.01); G01R 31/318544 (2013.01); G01R 31/318552 (2013.01);
Abstract
Scan cells of a set of scan chains may be partitioned into at least two control groups of scan cells and at least two observe groups of scan cells. Adjacent scan cells in the set of scan chains may belong to different control groups. Each observe group may include at most one scan cell from each control group, and each control group may include at most one scan cell from each observe group. The control groups and observe groups may be used to perform defect localization on the set of scan chains.