The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 2023
Filed:
Nov. 14, 2022
Guangdong University of Technology, Guangzhou, CN;
Jian Gao, Guangzhou, CN;
Zhuojun Zheng, Guangzhou, CN;
Lanyu Zhang, Guangzhou, CN;
Haixiang Deng, Guangzhou, CN;
Guangdong University of Technology, Guangzhou, CN;
Abstract
This disclosure relates to optical three-dimensional (3D) measurement, and more particularly to a large-depth-range 3D measurement method, system, and device based on phase fusion. Sinusoidal fringes corresponding to multiple high-frequency binary fringe patterns varying in stripe width, a middle-frequency binary fringe pattern, and a low-frequency binary fringe pattern are formed and then projected onto a to-be-measured object. After modulated by height of the object, the sinusoidal fringes are collected, and wrapped phases of the collected sinusoidal fringes are calculated to determine absolute phases of high-frequency sinusoidal fringes. Phase errors of a high-frequency sinusoidal fringe under different fringe widths are calculated according to the defocusing degree. An optimal absolute phase is selected based on the phase errors for the large-depth range 3D measurement.