The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2023

Filed:

Sep. 07, 2022
Applicant:

Tokyo Seimitsu Co., Ltd., Tokyo, JP;

Inventors:

Hideki Morii, Tsuchiura, JP;

Katsufumi Moriyama, Tsuchiura, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/12 (2006.01); G01B 11/00 (2006.01); G01B 21/04 (2006.01); G01B 5/20 (2006.01);
U.S. Cl.
CPC ...
G01B 11/12 (2013.01); G01B 5/201 (2013.01); G01B 11/002 (2013.01); G01B 21/042 (2013.01);
Abstract

The inner surface shape measurement device, which measures an inner surface shape of a small hole formed in a workpiece, includes: a rotating body for rotating the workpiece around a rotation axis, and a linear-and-tilting-motion stage; an elongated probe capable of being inserted into the small hole of the workpiece; a probe linear-and-tilting-motion mechanism capable of adjusting posture of the probe; a camera, configured to be rotatable integrally with the rotating body, for imaging the probe from at least three circumferential positions on a rotation trajectory centered on a rotation axis; and a controller for adjusting the posture of the probe using the probe linear-and-tilting-motion mechanism based on an image taken by the camera at each of the circumferential positions.


Find Patent Forward Citations

Morii, Hideki. (2023). Inner surface shape measurement device, and alignment method and magnification calibration method for inner surface shape measurement device (U.S. Patent No. 11740072). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11740072

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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