The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2023
Filed:
Nov. 07, 2022
Kandou Labs SA, Lausanne, CH;
Ali Hormati, Ecublens Vaud, CH;
Charles Dedic, London, GB;
KANDOU LABS SA, Lausanne, CH;
Abstract
Methods and systems are described for measuring a vertical opening of a signal eye of a pulse amplitude modulated (PAM) signal received over a channel to determine a vertically-centered voltage decision threshold of a sampler receiving a sampling clock, determining channel-characteristic parameters indicative of a frequency response of the channel, determining a correctional vernier value from the channel-characteristic parameters, and generating a horizontally-centered voltage decision threshold that introduces a horizontal sampling offset in the sampling clock in a direction closer to a horizontal center of the signal eye by combining the vertically-centered voltage decision threshold and the correctional vernier value.