The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2023
Filed:
Aug. 13, 2015
Foursquare Labs, Inc., New York, NY (US);
David Shim, Seattle, WA (US);
Elliott Waldron, Seattle, WA (US);
Weilie Yi, Carlsbad, CA (US);
Nick Gerner, Seattle, WA (US);
George Varghese, Kirkland, WA (US);
Andrea Eatherly, New York, NY (US);
FOURSQUARE LABS, INC., New York, NY (US);
Abstract
A system and method for attributing in-store visits to exposure to advertisement ('ad') impressions associated with an ad campaign are disclosed. The system gathers impression data and uses that data to identify users who were exposed to the ad impressions. The system then uses location data, activity information and in some instances beacon data points reported by mobile devices of the impression users to determine if the impression users visited a target place during a conversion window. Based on the impression users who were exposed to the ad impressions, the system establishes a control group of users who were not exposed to the ad impressions to perform quasi-experimental analyses to assess whether the ad impressions had any impact on changing the impression users' physical in-store visitation behavior.