The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 22, 2023

Filed:

Aug. 31, 2021
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventor:

Nicholas T. Heath, Pittsboro, NC (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0653 (2013.01); G06F 3/0625 (2013.01); G06F 3/0679 (2013.01);
Abstract

A method includes utilizing, while delivery of power from a main power supply to a memory sub-system is interrupted, a processing device of the memory subsystem to monitor a characteristic of the memory sub-system associated with data retention at a non-volatile memory component of the memory sub-system. The method further includes utilizing, while delivery of power from a main power supply to a memory sub-system is interrupted, a processing device of the memory subsystem to predict, based on the monitored characteristic, an impending data loss event for the non-volatile memory component.


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Heath, Nicholas. (2023). Memory sub-system data loss prediction (U.S. Patent No. 11733910). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11733910

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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