The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 22, 2023

Filed:

Feb. 03, 2022
Applicant:

Jeol Ltd., Tokyo, JP;

Inventors:

Kazunori Tsukamoto, Tokyo, JP;

Shigeru Honda, Tokyo, JP;

Assignee:

JEOL Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/2252 (2018.01); H01J 37/22 (2006.01);
U.S. Cl.
CPC ...
G01N 23/2252 (2013.01); H01J 37/222 (2013.01);
Abstract

In an analyzer, an image processing unit performs processing of: dividing a measurement image into a plurality of partial measurement images, and dividing a reference image into a plurality of partial reference images; calculating a positional deviation amount of each of the partial measurement images relative to a corresponding partial reference image among the partial reference images; determining whether the positional deviation amount is a threshold or less; and correcting positional deviation of the measurement image based on the positional deviation amounts of the plurality of partial measurement images when the image processing unit has determined that the positional deviation amount is not the threshold or less.


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Tsukamoto, Kazunori. (2023). Analyzer and image processing method (U.S. Patent No. 11733188). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11733188

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