The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 22, 2023

Filed:

Dec. 29, 2020
Applicant:

Rigaku Corporation, Akishima, JP;

Inventors:

Kiyoshi Ogata, Tokyo, JP;

Sei Yoshihara, Saitama, JP;

Shuichi Kato, Tokyo, JP;

Kazuhiko Omote, Tokyo, JP;

Hiroshi Motono, Tokyo, JP;

Naoki Matsushima, Tokyo, JP;

Assignee:

RIGAKU CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/223 (2006.01); G01N 23/207 (2018.01);
U.S. Cl.
CPC ...
G01N 23/223 (2013.01); G01N 23/2076 (2013.01); G01N 2223/076 (2013.01); G01N 2223/0766 (2013.01); G01N 2223/406 (2013.01); G01N 2223/61 (2013.01); G01N 2223/611 (2013.01); G01N 2223/6113 (2013.01); G01N 2223/6116 (2013.01);
Abstract

This fluorescent X-ray analysis apparatus is provided with an X-ray irradiation unitfor irradiating a sample S with: X-rays, having an energy that exceeds the energy absorption edge value of Ag which is selected as a measurement target element, and that is no greater than the energy absorption edge value of Sn which is an adjacent element having a higher energy absorption edge value than Ag; and X-rays having an energy exceeding the energy absorption edge value of Sn which is selected as a measurement target element.


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