The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 22, 2023

Filed:

Mar. 14, 2017
Applicant:

Shin-etsu Handotai Co., Ltd., Tokyo, JP;

Inventors:

Kazuya Sato, Nasushiobara, JP;

Naoki Kamihama, Nishigo-mura, JP;

Hiromasa Hashimoto, Nishigo-mura, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B24B 37/32 (2012.01); G01B 11/30 (2006.01); H01L 21/306 (2006.01); G01B 11/02 (2006.01); B24B 37/30 (2012.01); G01B 11/24 (2006.01); H01L 21/304 (2006.01);
U.S. Cl.
CPC ...
B24B 37/32 (2013.01); B24B 37/30 (2013.01); G01B 11/02 (2013.01); G01B 11/24 (2013.01); G01B 11/306 (2013.01); H01L 21/304 (2013.01); H01L 21/30625 (2013.01);
Abstract

A method for selecting a template assembly includes: preparing a template assembly in which a template is concentrically attached on a base ring or a base plate having a larger outer diameter than the template, the template having a back pad to hold a workpiece back surface and a retainer ring positioned on the back pad and to hold an edge portion of the workpiece; non-destructively measuring a height position distribution of the retainer ring and the back pad on the template side of the template assembly, where an outer peripheral edge surface of the base ring or the base plate serves as a reference surface; calculating a flatness of the retainer ring and an average amount of step differences between the retainer ring and the back pad from the measured height position distribution; and selecting the template assembly based on the flatness and the average amount of step differences.


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