The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 22, 2023

Filed:

Sep. 17, 2020
Applicants:

Koh Young Technology Inc., Seoul, KR;

Kyungpook National University Industry-academic Cooperation Foundation, Daegu, KR;

Inventors:

Hyun Ki Lee, Daegu, KR;

Hyun Min Oh, Daegu, KR;

Min Young Kim, Daegu, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 34/20 (2016.01); A61B 90/00 (2016.01);
U.S. Cl.
CPC ...
A61B 34/20 (2016.02); A61B 90/39 (2016.02); A61B 2034/2048 (2016.02); A61B 2034/2055 (2016.02); A61B 2034/2057 (2016.02); A61B 2090/0818 (2016.02); A61B 2090/3983 (2016.02);
Abstract

A tracking system and a tracking method using the same are disclosed. The tracking system includes a marker, a camera unit, a first inertial measuring unit, a second inertial measuring unit and a tracking processing unit. The marker is fixed on the measurement object, and the camera unit outputs a marker image by photographing the marker. The first inertial measuring unit is fixed on the camera unit, and measures and outputs first inertia comprising first accelerated velocity and first angular velocity. The second inertial measuring unit is fixed to one of the measurement object and the marker, and measures and outputs second inertia comprising second accelerated velocity and second angular velocity. The tracking processing unit primarily extracts the position and the posture of the measurement object using the marker image, and secondarily extracts the position and the posture of the measurement object using the first and second inertias.


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