The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 2023

Filed:

Jul. 22, 2021
Applicant:

Taiwan Semiconductor Manufacturing Company Ltd., Hsinchu, TW;

Inventors:

Wei-Lin Chu, Hsinchu County, TW;

Hsin-Lun Tseng, Taoyuan, TW;

Sheng-Wen Huang, Hsinchu, TW;

Chih-Chung Huang, Hsinchu, TW;

Chi-Ming Tsai, Taipei, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/392 (2020.01); G03F 1/70 (2012.01); G03F 1/36 (2012.01); G03F 1/22 (2012.01); G03F 7/20 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G03F 1/70 (2013.01); G03F 1/22 (2013.01); G03F 1/36 (2013.01); G03F 7/2004 (2013.01); G06F 30/392 (2020.01); G06N 20/00 (2019.01);
Abstract

A method includes providing a first design layout including cells; updating a first cell in the plurality of cells using optical proximity correction to provide a first updated cell and a data set; training a model based on a layout-dependent parameter of a second design layout; and updating a second cell based on the data set and the model to provide a second updated cell. The model includes an input layer, a hidden layer and an output layer. Training the model includes obtaining converged values of nodes of the hidden layer. Obtaining converged values of nodes of the hidden layer includes providing information on edge segments before and after lithography enhancement to the input layer and the output layer, respectively, until values of nodes of the hidden layer attains convergence in terms of a cost function.


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