The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2023
Filed:
Jun. 11, 2019
Applicant:
Tektronix, Inc., Beaverton, OR (US);
Inventors:
Karl A. Rinder, Sparks, NV (US);
David A. Sailor, Boring, OR (US);
Josiah A. Bartlett, Forest Grove, OR (US);
Assignee:
Tektronix, Inc., Beaverton, OR (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/067 (2006.01); G01R 1/02 (2006.01); G01R 1/04 (2006.01); G01R 31/302 (2006.01);
U.S. Cl.
CPC ...
G01R 1/06788 (2013.01); G01R 1/025 (2013.01); G01R 1/04 (2013.01); G01R 31/3025 (2013.01);
Abstract
A test-and-measurement probe () for a test-and-measurement instrument (), the test-and-measurement probe having a probe head () and a touchscreen user interface (). The probe head is configured to obtain a signal from a device under test. The touchscreen user interface is configured to visually convey test-and-measurement information to a user and to accept user touch input. In embodiments, the touchscreen user interface is removably connected to a compbox () of the test-and-measurement probe, through a wired connection or wirelessly.