The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 2023

Filed:

May. 03, 2022
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventor:

Stephen D. Hanna, Fort Collins, CO (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/29 (2006.01); G06F 11/10 (2006.01);
U.S. Cl.
CPC ...
H03M 13/2906 (2013.01); G06F 11/1004 (2013.01); G06F 11/1068 (2013.01);
Abstract

Methods, systems, and devices for memory error correction based on layered error detection are described. In some examples, a memory system identifies, based on a first type of error detection procedure, that a set of bits includes a quantity of erroneous bits that is uncorrectable based on the first type of error detection procedure alone. The memory system generates one or more candidate sets of bits based on altering different groups of bits within the set of bits and evaluate one or more such candidate sets of bits using a second type of error detection procedure until a candidate set of bits is identified as error-free. The memory system then corrects the set of bits based on the candidate set of bits identified as error-free.


Find Patent Forward Citations

Loading…