The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 2023

Filed:

Feb. 25, 2021
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Jeongil Mun, Hwaseong-si, KR;

Kyeonghun Kim, Hwaseong-si, KR;

Taekyoon Park, Seoul, KR;

Jongwoo Sun, Hwaseong-si, KR;

Seeyub Yang, Seoul, KR;

Yongseok Lee, Yongin-si, KR;

Hyungjoo Lee, Hwaseong-si, KR;

Eunhee Jeang, Paju-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/32 (2006.01); H01J 9/24 (2006.01);
U.S. Cl.
CPC ...
H01J 37/32467 (2013.01); H01J 9/245 (2013.01); H01J 37/32119 (2013.01); H01J 37/32238 (2013.01); H01J 37/32972 (2013.01); H01J 2237/103 (2013.01);
Abstract

A method of forming a plasma processing apparatus comprises providing a chamber, the chamber including a wall defining an interior, and a viewport extending through the wall. An analysis apparatus connected to the viewport may be formed. The analysis apparatus includes an analyzer adjacent to the chamber, a probe connected to the analyzer and aligned with the viewport, and a first window aligned with the probe, the first window having a first surface, and a second surface at an opposite side relative to the first surface, the second surface being exposed to the interior of the chamber, and the second surface of the first window has a scattering surface.


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