The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 2023

Filed:

Apr. 28, 2021
Applicant:

The Institute of Optics and Electronics, the Chinese Academy of Sciences, Sichuan, CN;

Inventors:

Xiangang Luo, Sichuan, CN;

Ping Gao, Sichuan, CN;

Mingbo Pu, Sichuan, CN;

Xiaoliang Ma, Sichuan, CN;

Xiong Li, Sichuan, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 9/00 (2006.01); H04N 25/71 (2023.01); G05B 19/05 (2006.01); G06T 7/00 (2017.01); H04N 23/695 (2023.01);
U.S. Cl.
CPC ...
G03F 9/7026 (2013.01); G05B 19/056 (2013.01); G06T 7/0004 (2013.01); H04N 25/71 (2023.01); G05B 2219/13004 (2013.01); H04N 23/695 (2023.01);
Abstract

Provided is an intelligent correction device control system for a super-resolution lithography precision mask, including: a sixteen-way pneumatic fine-tuning mask deformation control subsystem configured to deform a mask, detect a force value of a mask deformation, compare the force value of the mask deformation with an output force set value, and generate a first control feedback quantity to adjust a force deforming the mask, so as to control a deformation quantity of the mask; and an alignment subsystem configured to acquire images of the mask and a substrate, and adjust a position between the mask and the substrate according to the images, so as to align the mask with the substrate.


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