The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 2023
Filed:
Mar. 04, 2021
Applicant:
Carl Zeiss Microscopy Gmbh, Jena, DE;
Inventors:
Oliver Holub, Jena, DE;
Mirko Liedtke, Jena, DE;
Stanislav Kalinin, Weimar, DE;
Dieter Huhse, Berlin, DE;
Assignee:
CARL ZEISS MICROSCOPY GMBH, Jena, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0072 (2013.01); G02B 21/008 (2013.01); G02B 21/0032 (2013.01); G02B 21/0036 (2013.01);
Abstract
Apparatus and method for capturing an image having a detection beam path for guiding detection radiation from a sample to a detector having a plurality of detector elements. The detector has no more than ten and, preferably, four or five detector elements; and an evaluation unit, which is configured to carry out an evaluation in accordance with the Airyscan method on the image data captured by means of the detector and which generates a high-resolution image.